Correlation between write endurance and electrical low frequency noise in MgO based magnetic tunnel junctions

✍ Scribed by Amara-Dababi, S.; Béa, H.; Sousa, R. C.; Baraduc, C.; Dieny, B.

• Book ID: 119938876
• Publisher: American Institute of Physics
• Year: 2013
• Tongue: English
• Weight: 1017 KB
• Volume: 102
• Category: Article
• ISSN: 0003-6951
• DOI: 10.1063/1.4788816