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Electron Transport Through Metal–Multiwall Carbon Nanotube Interfaces

โœ Scribed by Ngo, Q.; Petranovic, D.; Krishnan, S.; Cassell, A.M.; Ye, Q.; Li, J.; Meyyappan, M.; Yang, C.Y.


Book ID
120530921
Publisher
IEEE
Year
2004
Tongue
English
Weight
398 KB
Volume
3
Category
Article
ISSN
1536-125X

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We have studied current-voltage (I-V ) characteristics of metal-on-tube metal-multiwall carbon nanotubemetal structures as a function of gate voltage. Device resistances ranged from about 10 kV to several MV, depending on the electrode metal and its deposition condition. When the resistance was much