Resistance dependence of transport prope
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Akinobu Kanda; Kazuhito Tsukagoshi; Seiji Uryu; Youiti Ootuka; Yoshinobu Aoyagi
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Article
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2002
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Elsevier Science
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English
โ 438 KB
We have studied current-voltage (I-V ) characteristics of metal-on-tube metal-multiwall carbon nanotubemetal structures as a function of gate voltage. Device resistances ranged from about 10 kV to several MV, depending on the electrode metal and its deposition condition. When the resistance was much