✦ LIBER ✦

Electron transfer in Zinc-blende III–V compounds

✍ Scribed by C.C. Wang; Leo H. Spinar

Publisher: Elsevier Science
Year: 1963
Tongue: English
Weight: 270 KB
Volume: 24
Category: Article
ISSN: 0022-3697
DOI: 10.1016/0022-3697(63)90073-8

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Core excitons for the (110) surface of z

Core excitons for the (110) surface of zinc blende III–V semiconductors

✍ Murray S. Daw; D.L. Smith; T.C. McGill 📂 Article 📅 1983 🏛 Elsevier Science 🌐 English ⚖ 375 KB

Critical thickness in heteroepitaxial gr

Critical thickness in heteroepitaxial growth of zinc-blende semiconductor compounds

✍ G. Cohen-Solal; F. Bailly; M. Barbé 📂 Article 📅 1994 🏛 Elsevier Science 🌐 English ⚖ 501 KB

Dangling bond surfaces states in (111) f

Dangling bond surfaces states in (111) faces of zinc-blende compounds

✍ B. Djafari-Rouhani; L. Dobrzynski; F. Florès; M. Lannoo; C. Tejedor 📂 Article 📅 1978 🏛 Elsevier Science 🌐 English ⚖ 213 KB

Electron-hole drops in A2B6 compounds wi

Electron-hole drops in A2B6 compounds with blende type structure

✍ E. Kuokštis; R. Baltramiejùnas; J. Vaitkus 📂 Article 📅 1982 🏛 Elsevier Science 🌐 English ⚖ 287 KB

Effective charge transfer and covalent b

Effective charge transfer and covalent bonding in III–V compounds

✍ Alfred E. Attard 📂 Article 📅 1972 🏛 Elsevier Science 🌐 English ⚖ 728 KB

Cross-sectional reflection electron micr

Cross-sectional reflection electron microscopy of III-V compound epilayers

✍ De Cooman, B. C. ;Kuesters, K.-H. ;Carter, C. B. 📂 Article 📅 1985 🏛 Wiley (John Wiley & Sons) 🌐 English ⚖ 937 KB

Reflection electron microscopy (REM) is shown to be applicable to the testing of the quality of A1,Gal -.As/GaAs layer structures. Crosssectional images of quantum well structures with layer thickness down to 1 nm can be obtained. The practical aspects of the REM technique are presented. The most im