Calibration of focusing steps and image
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Hsu, Tung
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Article
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1987
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Wiley (John Wiley & Sons)
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English
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Reflection electron microscopy (REM) is used to calibrate the focusing steps and rotation of electron microscopes. The calibration of focusing steps is done by the direct measurement of the shift on in-focus positions in the REM micrographs. Rotations between the diffraction patterns and images are