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Electron Spin Resonance Measurements and Electrical Characteristics, before and after Electroforming, of Thin Films of SiO/Nb205 and Nb205

โœ Scribed by Al-Ismail, S. A. Y. ;Arshak, K. ;Hogarth, C. A.


Publisher
John Wiley and Sons
Year
1985
Tongue
English
Weight
712 KB
Volume
89
Category
Article
ISSN
0031-8965

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