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Electron spectroscopy analysis of in-depth profiles of passive films formed on iron in Cl−-containing solutions

✍ Scribed by Z. Szklarska-Smialowska; H. Viefhaus; M. Janik-Czachor


Book ID
117086972
Publisher
Elsevier Science
Year
1976
Tongue
English
Weight
181 KB
Volume
16
Category
Article
ISSN
0010-938X

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In-depth composition profiles of the an&c oxide films grown on Al (1 I1 ), (I 10) and (100) single crystal electrodes in ammonium borate were studied by Auger electron spectroscopy with Ar ion etching. The oxide film had the composition of Ai,O, as referenced to an authentic a-Al,O, single crystal.