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Electron Screening and Mobility in Heavily Doped Silicon

✍ Scribed by H. K. Sy; D. K. Desai; C. K. Ong

Publisher: John Wiley and Sons
Year: 1985
Tongue: English
Weight: 321 KB
Volume: 130
Category: Article
ISSN: 0370-1972
DOI: 10.1002/pssb.2221300244

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