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Electron-Related Phenomena at the Interface

✍ Scribed by Rao, R.; Lorenzi, P.; Ghidini, G.; Palma, F.; Irrera, F.

Book ID: 114619908
Publisher: IEEE
Year: 2010
Tongue: English
Weight: 222 KB
Volume: 57
Category: Article
ISSN: 0018-9383
DOI: 10.1109/ted.2009.2039100

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