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Electron Paramagnetic Resonance Analysis of Strain-Induced Defects in Semi-Insulating GaAs

✍ Scribed by S. Benakki; A. Goltzene; C. Schwab; Wang Guangyu; Zou Yuanxi

Publisher: John Wiley and Sons
Year: 1986
Tongue: English
Weight: 481 KB
Volume: 138
Category: Article
ISSN: 0370-1972
DOI: 10.1002/pssb.2221380115

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