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Electron microscopy and positron investigations of plastically deformed GaAs

โœ Scribed by Leipner, H. S. ;Krause-Rehberg, R. ;Kupsch, A. ;Drost, T. ;Polity, A.


Publisher
John Wiley and Sons
Year
1993
Tongue
English
Weight
441 KB
Volume
138
Category
Article
ISSN
0031-8965

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Defect Properties in Plastically Deforme
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Positron lifetime spectra have been measured on plastically deformed Zn-doped p-type GaAs with strain ranging from 0 to 15% at room temperature. The lifetime spectra were analyzed using PATFIT and MELT programs. Two lifetime components were observed in deformed samples. The second lifetime t 2 $ 400