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Electron microscope weak-beam imaging of stacking fault tetrahedra: observations and simulations

โœ Scribed by M. L. Jenkins; Z. Zhou; S. L. Dudarev; A. P. Sutton; M. A. Kirk


Publisher
Springer
Year
2006
Tongue
English
Weight
525 KB
Volume
41
Category
Article
ISSN
0022-2461

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