𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Electron holography study on the microstructure of magnetic tunnelling junctions

✍ Scribed by Q.Y Xu; Y.G Wang; B You; J Du; A Hu; Z Zhang

Book ID
108290596
Publisher
Elsevier Science
Year
2004
Tongue
English
Weight
512 KB
Volume
98
Category
Article
ISSN
0304-3991

No coin nor oath required. For personal study only.

πŸ“œ SIMILAR VOLUMES

Transmission Electron Microscopy Study o
Transmission Electron Microscopy Study of Thermally Annealed Low Resistance Magnetic Tunnel Junction
✍ Kyung, H. ;Lee, J.H. ;Yoon, C.S. ;Kim, C.K. πŸ“‚ Article πŸ“… 2002 πŸ› John Wiley and Sons 🌐 English βš– 296 KB πŸ‘ 1 views

Low-resistance magnetic tunneling junctions consisting of Ta/NiFe/Cu/NiFe/IrMn/CoFe/Al (6.6 and 7.7 A)-oxide/CoFe/NiFe/Ta were fabricated with the plasma-oxidized insulation layer. Electrical properties and microstructure of the junctions are characterized before and after annealing the junction at