The dependence of inelastic electron tunneling on junction roughness

✍ Scribed by P.R. Varker; J.R. Kirtley; J.C. Tsang

• Book ID: 103372934
• Publisher: Elsevier Science
• Year: 1983
• Tongue: English
• Weight: 321 KB
• Volume: 45
• Category: Article
• ISSN: 0038-1098
• DOI: 10.1016/0038-1098(83)90312-5