𝔖 Bobbio Scriptorium
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Electron energy loss spectroscopy with resolution below 1 meV

✍ Scribed by H. Ibach


Book ID
103739464
Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
432 KB
Volume
64-65
Category
Article
ISSN
0368-2048

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## Abstract Measurements of thickness using electron energy loss spectroscopy (EELS) are revised. Absolute thickness values can be quickly and accurately determined with the Kramers‐Kronig sum method. The EELS data analysis is even much easier with the log‐ratio method, however, absolute calibratio