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Electron energy-loss spectroscopy characterization of pyramidal defects in metalorganic vapor-phase epitaxy Mg-doped GaN thin films

✍ Scribed by Benaissa, M.; VenneÌgueÌs, P.; Beaumont, B.; Gibart, P.; Saikaly, W.; Charai, A.

Book ID: 120289500
Publisher: American Institute of Physics
Year: 2000
Tongue: English
Weight: 629 KB
Volume: 77
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.1313811

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