β Scribed by T. Ichikawa
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Amorphous thin films of tellurium have been prepared by condensation on the substrate at liquid helium or nitrogen temperature in high vacuum, and a transmission electron diffraction study of these films has been undertaken. Diffraction patterns of such films show diffuse halos, which are characteristic of a highly disordered structure. A radial distribution analysis has been carried out in order to investigate the local atomic arrangement in the films. The result leads to the conclusion that the atoms in the films are arranged in short chains.
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Experimental results obtained by electron diffraction (ED) and extended electron energy loss fine structure (EXELFS) techniques to study the local atomic order in amorphous materials such as carbon, silicon, and its oxides are described. Potential applications of ED and EXELFS techniques and their l
The local electronic structure of tellurium atoms in As 2 Te 3 -GeTe crystalline compounds is experimentally studied by the combined use of X-ray photoelectron spectroscopy (XPS), X-ray absorption spectroscopy (XAS) and 125 Te Mo Β¨ssbauer spectroscopy. From As 2 Te 3 to GeTe it is found that: (i) th