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Electron diffraction studies of contact reactions in amorphous As2S3 thin films

โœ Scribed by A.G. Fitzgerald


Publisher
Elsevier Science
Year
1982
Tongue
English
Weight
572 KB
Volume
98
Category
Article
ISSN
0040-6090

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Study of In2S3Thin Films by Diffraction
โœ V.G. Bessergenev; A.V. Bessergenev; E.N. Ivanova; Yu.A. Kovalevskaya ๐Ÿ“‚ Article ๐Ÿ“… 1998 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 257 KB

The crystal structure of In 2 S 3 thin films obtained by the chemical vapor deposition method from the volatile complex compounds indium(III) isopropyl xanthate and indium(III) diethyl dithiocarbonate was studied by synchrotron radiation diffraction. High photon beam intensity (3 ุ‹ 10 10 photons/mm