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Electron diffraction and high-resolution transmission microscopy studies of nanostructured Si thin films deposited by radiofrequency dusty plasmas

✍ Scribed by G Viera; S Huet; M Mikikian; L Boufendi


Book ID
114085450
Publisher
Elsevier Science
Year
2002
Tongue
English
Weight
487 KB
Volume
403-404
Category
Article
ISSN
0040-6090

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