𝔖 Bobbio Scriptorium
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Electron Beam Probing—A Solution for MCM Test and Failure Analysis

✍ Scribed by R. Schmid; R. Schmitt; M. Brunner; O. Gessner; M. Sturm

Book ID
110261078
Publisher
Springer US
Year
1997
Tongue
English
Weight
292 KB
Volume
10
Category
Article
ISSN
0923-8174

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✍ P.-F. Staub; P. Jonnard; F. Vergand; J. Thirion; and C. Bonnelle 📂 Article 📅 1998 🏛 John Wiley and Sons 🌐 English ⚖ 565 KB

The model called IntriX, designed to interpret quantitatively electron probe analysis data, was tested via confrontations between its results and experimental or Monte Carlo data. These confrontations were established for in-depth ionization distributions U(qz) and characteristic x-ray relative inte