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Electron beam lithography and ion implantation techniques for fabrication of high-Tc Josephson junctions

✍ Scribed by R. Barth; A.H. Hamidi; B. Hadam; J. Hollkott; D. Dunkmann; J. Auge; H. Kurz


Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
605 KB
Volume
30
Category
Article
ISSN
0167-9317

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## Abstract The surface properties of materials are believed to control most of the biological reactions toward implanted materials. To study the surface structure, elemental distribution, and morphology, using transmission electron microscopy (TEM) techniques, thin foils of the surface (in cross‐s