Electron beam induced current study of ion beam milling type conversion in molecular beam epitaxy vacancy-doped CdxHg1−xTe

✍ Scribed by R. Haakenaasen; T. Colin; H. Steen; L. Trosdahl-Iversen

• Book ID: 107452575
• Publisher: Springer US
• Year: 2000
• Tongue: English
• Weight: 426 KB
• Volume: 29
• Category: Article
• ISSN: 0361-5235
• DOI: 10.1007/s11664-000-0236-8