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Electron beam induced current assessment of doped and diffused junctions in epitaxial CdxHg1−xTe

✍ Scribed by M.P. Hastings; C.D. Maxey; B.E. Matthews; N.E. Metcalfe; P. Capper; C.L. Jones; I.G. Gale


Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
645 KB
Volume
138
Category
Article
ISSN
0022-0248

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