Electron-beam-induced-current investigations on MOS and MNOS devices: R. Hezel Solid-St. Electron. 22, 735 (1979)

• Book ID: 108361128
• Publisher: Elsevier Science
• Year: 1981
• Tongue: English
• Weight: 132 KB
• Volume: 12
• Category: Article
• ISSN: 0026-2692
• DOI: 10.1016/s0026-2692(81)80351-5