✦ LIBER ✦
The detrimental influence of stacking faults on the refresh time of MOS memories : H. Strack, K. R. Mayer and B. O. Kolbesen. Solid-St. Electron.22, 135 (1979)
- Publisher
- Elsevier Science
- Year
- 1979
- Tongue
- English
- Weight
- 124 KB
- Volume
- 19
- Category
- Article
- ISSN
- 0026-2714
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