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Electron beam induced conductivity measurements on porous silicon based structures

✍ Scribed by Jasutis, V.; Šimkienė, I.; Krotkus, A.

Book ID: 121650825
Publisher: American Institute of Physics
Year: 1995
Tongue: English
Weight: 451 KB
Volume: 67
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.114390

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