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Electron-beam evaporation and interface characterization of Bi2Sr2Ca1Cu2Oy thin films on SrTiO3- and Si-substrates

✍ Scribed by V Klocke; A Pfau; W Albrecht; C Valder; U Breuer; H Kurz; M Fleuster; G Güntherodt

Book ID
116017826
Publisher
Elsevier Science
Year
1990
Weight
512 KB
Volume
164-165
Category
Article
ISSN
0022-5088

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