Electron beam dosimetry for a thin-layer absorber irradiated by 300-keV electrons

✍ Scribed by Toshiyuki Kijima; Yoshiaki Nakase

• Publisher: Elsevier Science
• Year: 1993
• Tongue: English
• Weight: 625 KB
• Volume: 44
• Category: Article
• ISSN: 0969-8043
• DOI: 10.1016/0969-8043(93)90134-v

✦ Synopsis

Depthdose

distributions in thin-layer absorbers were measured for 300-keV electrons from a scanningtype irradiation system, the electrons having penetrated through a Ti-window and an air gap. Irradiations of stacks of cellulose triacetate(CTA) film were carried out using either a conveyer (i.e. dynamic irradiation)

or fixed (i.e. static) irradiation.

The sample was irradiated using various angles of incidence of electrons, in order to examine the effect of obliqueness of electron incidence at low-energy representative of routine radiation curing of thin polymeric or resin layers. Dynamic irradiation gives broader and shallower depthdose distributions than static irradiation. Greater obliqueness of incident electrons gives results that can be explained in terms of broader and shallower depth-dose distributions.

The backscattering of incident electrons by a metal backing material enhances the absorbed dose in a polymeric layer and changes the overall distribution.

It is suggested that any theoretical estimations of the absorbed dose in thin layers irradiated in electron beam curing must be accomplished and supported by experimental data such as that provided by this investigation.