<p><P>Electron backscatter diffraction (EBSD), when employed as an additional characterization technique to a scanning electron microscope (SEM), enables individual grain orientations, local texture, point-to-point orientation correlations, and phase identification and distributions to be determined
Electron Backscatter Diffraction in Materials Science
โ Scribed by David J. Dingley (auth.), Adam J. Schwartz, Mukul Kumar, Brent L. Adams (eds.)
- Publisher
- Springer US
- Year
- 2000
- Tongue
- English
- Leaves
- 352
- Category
- Library
No coin nor oath required. For personal study only.
โฆ Table of Contents
Front Matter....Pages i-xvi
The Development of Automated Diffraction in Scanning and Transmission Electron Microscopy....Pages 1-18
Theoretical Framework for Electron Backscatter Diffraction....Pages 19-30
Representations of Texture in Orientation Space....Pages 31-38
Rodrigues-Frank Representations of Crystallographic Texture....Pages 39-50
Fundamentals of Automated EBSD....Pages 51-64
Studies on the Accuracy of Electron Backscatter Diffraction Measurements....Pages 65-74
Phase Identification Using Electron Backscatter Diffraction in the Scanning Electron Microscope....Pages 75-89
Three-Dimensional Orientation Imaging....Pages 91-104
Automated Electron Backscatter Diffraction: Present State and Prospects....Pages 105-122
EBSD: Buying a System....Pages 123-126
Hardware and Software Optimization for Orientation Mapping and Phase Identification....Pages 127-134
An Automated EBSD Acquisition and Processing System....Pages 135-140
Advanced Software Capabilities for Automated EBSD....Pages 141-152
Strategies for Analyzing EBSD Datasets....Pages 153-170
Structure-Properties Relations: EBSD-Based Material-Sensitive Design....Pages 171-180
Use of EBSD Data in Mesoscale Numerical Analyses....Pages 181-198
Characterization of Deformed Microstructures....Pages 199-212
Anisotropic Plasticity Modeling Incorporating EBSD Characterization of Tantalum and Zirconium....Pages 213-229
Measuring Strains Using Electron Backscatter Diffraction....Pages 231-246
Mapping Residual Plastic Strain in Materials Using Electron Backscatter Diffraction....Pages 247-264
EBSD Contra TEM Characterization of a Deformed Aluminum Single Crystal....Pages 265-276
Continuous Recrystallization and Grain Boundaries in a Superplastic Aluminum Alloy....Pages 277-290
Analysis of Facets and Other Surfaces Using Electron Backscatter Diffraction....Pages 291-298
EBSD of Ceramic Materials....Pages 299-318
Grain Boundary Character Based Design of Polycrystalline High Temperature Superconducting Wires....Pages 319-336
Back Matter....Pages 337-339
โฆ Subjects
Characterization and Evaluation of Materials; Animal Anatomy / Morphology / Histology; Geochemistry; Physical Chemistry; Biochemistry, general
๐ SIMILAR VOLUMES
Crystallographic texture or preferred orientation has long been known to strongly influence material properties. Historically, the means of obtaining such texture data has been though the use of x-ray or neutron diffraction for bulk texture measurements, or transmission electron microscopy (TEM) or
<p><P>Electron backscatter diffraction (EBSD), when employed as an additional characterization technique to a scanning electron microscope (SEM), enables individual grain orientations, local texture, point-to-point orientation correlations, and phase identification and distributions to be determined
<p><P>Electron backscatter diffraction (EBSD), when employed as an additional characterization technique to a scanning electron microscope (SEM), enables individual grain orientations, local texture, point-to-point orientation correlations, and phase identification and distributions to be determined
Crystallographic texture or preferred orientation has long been known to strongly influence material properties. Historically, the means of obtaining such texture data has been though the use of x-ray or neutron diffraction for bulk texture measurements, or transmission electron microscopy (TEM) or