๐”– Scriptorium
โœฆ   LIBER   โœฆ

๐Ÿ“

Electron Backscatter Diffraction in Materials Science

โœ Scribed by A. Schwartz, et al.,


Publisher
Kluwer
Year
2000
Tongue
English
Leaves
341
Category
Library

โฌ‡  Acquire This Volume

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES


Electron Backscatter Diffraction in Mate
โœ Robert A. Schwarzer, David P. Field (auth.), Adam J. Schwartz, Mukul Kumar, Bren ๐Ÿ“‚ Library ๐Ÿ“… 2009 ๐Ÿ› Springer US ๐ŸŒ English

<p><P>Electron backscatter diffraction (EBSD), when employed as an additional characterization technique to a scanning electron microscope (SEM), enables individual grain orientations, local texture, point-to-point orientation correlations, and phase identification and distributions to be determined

Electron Backscatter Diffraction in Mate
โœ Adam J. Schwartz,Mukul Kumar,Brent L. Adams ๐Ÿ“‚ Library ๐Ÿ“… 2000 ๐ŸŒ English

Crystallographic texture or preferred orientation has long been known to strongly influence material properties. Historically, the means of obtaining such texture data has been though the use of x-ray or neutron diffraction for bulk texture measurements, or transmission electron microscopy (TEM) or

Electron Backscatter Diffraction in Mate
โœ Robert A. Schwarzer, David P. Field (auth.), Adam J. Schwartz, Mukul Kumar, Bren ๐Ÿ“‚ Library ๐Ÿ“… 2009 ๐Ÿ› Springer US ๐ŸŒ English

<p><P>Electron backscatter diffraction (EBSD), when employed as an additional characterization technique to a scanning electron microscope (SEM), enables individual grain orientations, local texture, point-to-point orientation correlations, and phase identification and distributions to be determined

Electron Backscatter Diffraction in Mate
โœ Robert A. Schwarzer, David P. Field (auth.), Adam J. Schwartz, Mukul Kumar, Bren ๐Ÿ“‚ Library ๐Ÿ“… 2009 ๐Ÿ› Springer US ๐ŸŒ English

<p><P>Electron backscatter diffraction (EBSD), when employed as an additional characterization technique to a scanning electron microscope (SEM), enables individual grain orientations, local texture, point-to-point orientation correlations, and phase identification and distributions to be determined

Electron backscatter diffraction in mate
โœ Adam J Schwartz; Mukul Kumar; B L Adams ๐Ÿ“‚ Library ๐Ÿ“… 2000 ๐Ÿ› Kluwer Academic ๐ŸŒ English

Crystallographic texture or preferred orientation has long been known to strongly influence material properties. Historically, the means of obtaining such texture data has been though the use of x-ray or neutron diffraction for bulk texture measurements, or transmission electron microscopy (TEM) or