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Electron backscatter diffraction as a useful method for alloys microstructure characterization

✍ Scribed by Leszek Klimek; Bożena Pietrzyk

Book ID
116598147
Publisher
Elsevier Science
Year
2004
Tongue
English
Weight
739 KB
Volume
382
Category
Article
ISSN
0925-8388

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Quantitative microstructure characterization of self-annealed copper films with electron backscatter diffraction
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## Abstract Electron backscatter diffraction (EBSD) was applied to analyze cross sections of self‐annealed copper electrodeposits, for which earlier the kinetics of self‐annealing had been investigated by __in‐situ__ X‐ray diffraction (XRD). The EBSD investigations on the grain size, grain boundary