Electron and ion microscopy and microanalysis—principles and applications (second edition): Lawrence E. Murr Marcel Dekker, 1991, ISBN 0-8247-8556-8, pp 865, $224.25

✍ Scribed by M.J.L. Percival

• Publisher: Elsevier Science
• Year: 1994
• Tongue: English
• Weight: 276 KB
• Volume: 26
• Category: Article
• ISSN: 0030-3992
• DOI: 10.1016/0030-3992(94)90029-9