Electron and ion microscopy and microanalysis: Principles and applications second edition, revised and expanded: by Lawrence E. Murr; published by Marcel Dekker, Inc., New York, Basel, Hong Kong, 1991, xiv + 837 pp., ISBN 0-8247-8556-8

✍ Scribed by Alexander H. King

• Publisher: Elsevier Science
• Year: 1994
• Tongue: English
• Weight: 141 KB
• Volume: 174
• Category: Article
• ISSN: 0921-5093
• DOI: 10.1016/0921-5093(94)91094-4