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Electromigration studies using in situ TEM electrical resistance measurements

✍ Scribed by C.Y. Chang; V.D. Vankar; Y.C. Lee; R.W. Vook; A.J. Patrinos; J.A. Schwarz

Publisher: Elsevier Science
Year: 1990
Tongue: English
Weight: 324 KB
Volume: 41
Category: Article
ISSN: 0042-207X
DOI: 10.1016/0042-207x(90)93981-n

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