Electromigration-driven resistance switching in non-magnetic tunnel junctions

✍ Scribed by J. Ventura; A.M. Pereira; J.M. Teixeira; F. Carpinteiro; J.P. Araujo; J.B. Sousa; Y. Liu; Z. Zhang; P.P. Freitas

• Book ID: 116600240
• Publisher: Elsevier Science
• Year: 2006
• Tongue: English
• Weight: 200 KB
• Volume: 423
• Category: Article
• ISSN: 0925-8388
• DOI: 10.1016/j.jallcom.2005.12.105