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Asymmetric electromigration-driven resistive switching in tunnel junctions

✍ Scribed by J. Ventura; J.M. Teixeira; J.P. Araujo; F. Carpinteiro; J.B. Sousa; Z. Zhang; Y. Liu; P.P. Freitas


Book ID
116671225
Publisher
Elsevier Science
Year
2008
Tongue
English
Weight
193 KB
Volume
354
Category
Article
ISSN
0022-3093

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