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Electromigration behaviour and the lifetime of aluminum thin film conductors under superimposed dc and noise powers

✍ Scribed by Luby, Ŝ. ;Lobotka, P. ;Bezák, V.

Publisher: John Wiley and Sons
Year: 1980
Tongue: English
Weight: 642 KB
Volume: 60
Category: Article
ISSN: 0031-8965
DOI: 10.1002/pssa.2210600225

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