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Electrode-Based Causes of Delaminations in Multilayer Ceramic Capacitors

✍ Scribed by John G. Pepin; William Borland; Patrick O'Callaghan; Richard J. S. Young

Book ID
110824205
Publisher
John Wiley and Sons
Year
1989
Tongue
English
Weight
490 KB
Volume
72
Category
Article
ISSN
0002-7820

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Nondestructive detection of delamination
Nondestructive detection of delaminations in multilayer ceramic capacitors using improved digital speckle correlation method
✍ Y. C. Chan; X. Dai; G. C. Jin; N. K. Bao; P. S. Chung πŸ“‚ Article πŸ“… 1997 πŸ› John Wiley and Sons 🌐 English βš– 364 KB

The use of an impro¨ed digital speckle correlation method ( ) DSCM was demonstrated for the in situ and nondestructi¨e detection of delaminations in layered-structure microcomponents such as multi-( ) layer ceramic capacitors MLCs in surface-mount printed circuit board assemblies. The delaminations