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Electrochemical studies of capacitance in cerium oxide thin films and its relationship to anionic and electronic defect densities

✍ Scribed by Chueh, William C.; Haile, Sossina M.

Book ID: 120488457
Publisher: Royal Society of Chemistry
Year: 2009
Tongue: English
Weight: 658 KB
Volume: 11
Category: Article
ISSN: 1463-9076
DOI: 10.1039/b910903j

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