Microstructural Characterization of Elec
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T. Mahalingam; V.S. John; G. Ravi; P.J. Sebastian
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Article
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2002
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John Wiley and Sons
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English
โ 294 KB
๐ 2 views
Thin films of zinc telluride (ZnTe) were electrosynthesized on tin oxide coated conducting glass substrates at various bath temperatures. The deposited films were characterized by x-ray diffraction (XRD) and scanning electron microscopy (SEM). The structure was found to be cubic with preferential or