A new window to local studies of interface phenomena at solid state surfaces has been opened by the development of local probe techniques such as Scanning Tunneling Microscopy (STM) or Atomic Force Microscopy (AFM) and related methods during the past fifteen years. The in-situ application of local probe methods in different systems belongs to modern nanotechnology and has two aspects: an analytical aspect and a preparative aspect.
The first aspect covers the application of the local probe methods to characterize thermodynamic, structural and dynamic properties of solid state surfaces and interfaces and to investigate local surface reactions. Two methods which are still in the beginning of their development represent the second aspect: tip and cantilever. They can be used to form defined nano-objects such as molecular or atomic clusters, quantum dots etc. as well as to structure or modify solid state surfaces in the nanometer range.
This IUPAC monograph is a comprehensive treatment of both aspects and presents the current state of knowledge. It is written for scientists active in the area of nanotechnology.
Content:
Chapter 1 Local Probing of Electrochemical Processes at Non?ideal Electrodes (pages 1โ12): E. Ammann, P. I. Oden and H. Siegenthaler
Chapter 2 Electrochemistry and Nanotechnology (pages 13โ25): G. Staikov and W. J. Lorenz
Chapter 3 Imaging of Electrochemical Processes and Biological Macromolecular Adsorbates by in?situ Scanning Tunneling Microscopy (pages 27โ44): Jens E. T. Andersen, Jens Ulstrup and Per Moller
Chapter 4 Beyond the Landscapes: Imaging the Invisible (pages 45โ55): A. A. Kornyshev and M. Sumetskii
Chapter 5 Roughness Kinetics and Mechanism Derived from the Analysis of AFM and STM Imaging Data (pages 56โ71): R. C. Salvarezza and A. J. Arvia
Chapter 6 Electrodes with a defined mesoscopic structure (pages 73โ86): U. Stimming and R. Vogel
Chapter 7 In?situ Stress Measurements at the Solid/Liquid Interface Using a Micromechanical Sensor (pages 87โ99): T. A. Brunt, E. D. Chabala, T. Rayment, S. J. O'Shea and M. E. Welland
Chapter 8 Surface structure and electrochemistry: new insight by scanning tunneling microscopy (pages 101โ112): Giovanni Aloisi, Massimiliano Cavallini and Rolando Guidelli
Chapter 9 STM and AFM Studies of the Electrified Solid?Liquid Interface: Monolayers, Multilayers, and Organic Transformations (pages 112โ124): Andrew A. Gewirth and Brian K. Niece
Chapter 10 Scanning Probe Microscopy Studies of Molecular Redox Films (pages 125โ136): James E. Hudson and Hector D. Abruna
Chapter 11 New Aspects of Iodine?modified Single?crystal Electrodes (pages 137โ148): Kingo Itaya
Chapter 12 The growth and the surface properties of polypyrrole on single crystal graphite electrodes as studied by in?situ electrochemical scanning probe microscopy (pages 149โ157): Chr. Froeck, A. Bartl and L. Dunsch
Chapter 13 Nucleation and growth at metal electrode surfaces (pages 158โ170): O. M. Magnussen, F. Moller, M. R. Vogt and R. J. Behm
Chapter 14 STM Study of Electrodeposition of Strained?Layer Metallic Superlattices (pages 171โ184): T. P. Moffat
Chapter 15 STM Studies of Thin Anodic Oxide Layers (pages 184โ197): Philippe Marcus and Vincent Maurice
Chapter 16 Local Probing of Electrochemical Interfaces in Corrosion Research (pages 199โ213): A. Schreyer, T. Suter, L. Eng and H. Bohni
Chapter 17 Morphology and Nucleation of Ni?TiO2 LIGA layers (pages 215โ224): M. Strobel, U. Schmidt, K. Bade and J. Halbritter
Chapter 18 SPM Investigations on Oxide?covered Titanium Surfaces: Problems and Possibilities (pages 225โ239): C. Kobusch and J. W. Schultze
Chapter 19 Electrochemical surface processing of semiconductors at the atomic level (pages 240โ252): P. Allongue and C. Henry de Villeneuve
Chapter 20 In?situ Electrochemical AFM Study of Semiconductor Electrodes in Electrolyte Solutions (pages 253โ265): K. Uosaki and M. Koinuma
Chapter 21 In?situ STM and electrochemical UHV technique: Complementary, Noncompeting Techniques (pages 266โ276): M. P. Soriaga, K. Itaya and J. L. Stickney
Chapter 22 Growth morphology and molecular orientation of additives in electrocrystallization studied by surface?enhanced Raman spectroscopy (pages 277โ289): B. Reents and W. Plieth
Chapter 23 Instrumental Design and Prospects for NMR?Electrochemistry (pages 291โ302): James B. Day, Jianjun Wu, Eric Oldfield and Andrzej Wieckowski