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Electrochemical impedance spectroscopy of oxidized porous silicon

✍ Scribed by Mula, Guido; Tiddia, Maria V.; Ruffilli, Roberta; Falqui, Andrea; Palmas, Simonetta; Mascia, Michele

Book ID: 121692714
Publisher: Elsevier Science
Year: 2014
Tongue: English
Weight: 941 KB
Volume: 556
Category: Article
ISSN: 0040-6090
DOI: 10.1016/j.tsf.2014.01.044

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## Abstract Dielectric spectroscopy accompanied by infrared (IR) and photoluminescence (PL) spectroscopy have been utilized to reveal the correlation between transport, optical and structural properties of oxidized porous silicon (PS). Three relaxation processes at low‐, mid‐ and high‐temperatures