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Broadband dielectric spectroscopy of oxidized porous silicon

✍ Scribed by Axelrod, Ekaterina; Urbach, Benayahu; Sa'ar, Amir; Feldman, Yuri

Book ID
124067888
Publisher
Institute of Physics
Year
2006
Tongue
English
Weight
363 KB
Volume
39
Category
Article
ISSN
0022-3727

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## Abstract Dielectric spectroscopy accompanied by infrared (IR) and photoluminescence (PL) spectroscopy have been utilized to reveal the correlation between transport, optical and structural properties of oxidized porous silicon (PS). Three relaxation processes at low‐, mid‐ and high‐temperatures