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Electrochemical characterization of YSZ thick films deposited by dip-coating process

✍ Scribed by F. Mauvy; P. Lenormand; C. Lalanne; F. Ansart; J.M. Bassat; J.C. Grenier

Book ID
108192436
Publisher
Elsevier Science
Year
2007
Tongue
English
Weight
525 KB
Volume
171
Category
Article
ISSN
0378-7753

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Crack-free polycrystalline PZT (PbZrTiO ) thick films up to 15 mm with perovskite structure have been 3 prepared from a dip-coating process. The influence of substrate characteristics, withdrawal speed and ionic concentration of precursor solution on the morphology and microstructure of PZT film was