Simultaneous electro-thermal experimenta
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Coccetti, F. ;Plana, R.
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Article
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2008
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John Wiley and Sons
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English
β 300 KB
## Abstract An experimental setup for the characterization of electromagnetically induced heat on MEMS devices operating in high RF power regimes (> 5 W) is here proposed. The technique is based on infrared (IR) imaging of onβprobe DUT, in working conditions. The present work focuses on switches. U