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Electrical transport in La1−xCaxMnO3thin films at low temperatures

✍ Scribed by S Angappane; K Sethupathi; G Rangarajan


Book ID
107586940
Publisher
Springer-Verlag
Year
2002
Tongue
English
Weight
84 KB
Volume
58
Category
Article
ISSN
0304-4289

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A temperature dependenceofthe electrical resistance of thulium thin films has been studied in the temperature range from 4.2 K to 300 K. Thin films prepared in UHV in an thickness interval from 16 nm to 370 nm exhibit the increase of spin disorder resistivity and the decrease of Neel temperature wit