Electrical properties of thulium thin films at low temperatures

✍ Scribed by J. Dudáš; D. Knežo; A. Feher; H. Ratajczak

• Publisher: Elsevier Science
• Year: 1990
• Tongue: English
• Weight: 180 KB
• Volume: 165-166
• Category: Article
• ISSN: 0921-4526
• DOI: 10.1016/s0921-4526(90)80958-l

✦ Synopsis

A temperature dependenceofthe electrical resistance of thulium thin films has been studied in the temperature range from 4.2 K to 300 K. Thin films prepared in UHV in an thickness interval from 16 nm to 370 nm exhibit the increase of spin disorder resistivity and the decrease of Neel temperature with decreasing film thickness.