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Electrical Test Structure for the Measurement of Hermeticity in Electronic and MEMS Packages With Small Cavity Volumes

✍ Scribed by Costello, S.; Desmulliez, M. P. Y.; McCracken, S.; Abraham, E.; Lowrie, C.; Cargill, S.

Book ID: 124061413
Publisher: IEEE
Year: 2013
Tongue: English
Weight: 605 KB
Volume: 26
Category: Article
ISSN: 0894-6507
DOI: 10.1109/TSM.2013.2271213

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📜 SIMILAR VOLUMES

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