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Electrical, Rutherford backscattering and transmission electron microscopy studies of furnace annealed zinc implanted GaAs

✍ Scribed by S.S. Kular; B.J. Sealy; K.G. Stephens; D. Sadana; G.R. Booker

Publisher: Elsevier Science
Year: 1980
Tongue: English
Weight: 815 KB
Volume: 23
Category: Article
ISSN: 0038-1101
DOI: 10.1016/0038-1101(80)90099-4

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