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Electrical properties of polycrystalline silicon and zinc oxide semiconductors

โœ Scribed by S N Singh; S Kumari; B K Das


Book ID
112845020
Publisher
Springer-Verlag
Year
1984
Tongue
English
Weight
27 KB
Volume
6
Category
Article
ISSN
0250-4707

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Structural property of polycrystalline s
โœ Weiyan Wang; Jinhua Huang; Xianpeng Zhang; Ye Yang; Ruiqin Tan; Weijie Song ๐Ÿ“‚ Article ๐Ÿ“… 2011 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 616 KB

The structural properties of crystalline silicon (Si) films on bare and aluminum-doped zinc oxide (AZO)-coated glass substrates were comparatively investigated by X-ray diffractometer, Raman spectroscopy, and transmission electron microscope. It was observed that for the amorphous Si (a-Si) films on