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Electrical properties and deep traps in ZnO films grown by molecular beam epitaxy

✍ Scribed by A. Y. Polyakov; N. B. Smirnov; A. I. Belogorokhov; A. V. Govorkov; E. A. Kozhukhova; A. V. Osinsky; J. Q. Xie; B. Hertog; S. J. Pearton

Book ID: 126597771
Publisher: AVS (American Vacuum Society)
Year: 2007
Tongue: English
Weight: 628 KB
Volume: 25
Category: Article
ISSN: 0734-211X
DOI: 10.1116/1.2790918

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